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1

[IEEE 2014 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Hefei, China (2014.8.27-2014.8.30)] 2014 IEEE International Symposium on Radio-Frequency Integration Technology - An ultra-low quiescent current output capacitor-less low-dropout regulator with a novel slew-rate-enhanced circuit

Chen, Yang, Yang, Yizhong, Du, Longjie, Xie, Guangjun, Cheng, Xin, Yi, Maoxiang

Year:

2014

Language:

english

File:

PDF, 357 KB

english, 2014

2

A single event transient detector in SRAM-based FPGAs

Xu, Xiumin, Liang, Huaguo, Huang, Zhengfeng, Jiang, Cuiyun, Lu, Yingchun, Yan, Aibin, Ni, Tianming, Yi, Maoxiang

Journal:

IEICE Electronics Express

Year:

2017

Language:

english

File:

PDF, 468 KB

english, 2017

3

Whole transcriptome sequencing identified a distinct subtype of acute lymphoblastic leukemia with predominant genomic abnormalities of EP300 and CREBBP

Qian, Maoxiang, Zhang, Hui, Kham, Shirley Kow-Yin, Liu, Shuguang, Jiang, Chuang, Zhao, Xujie, Lu, Yi, Goodings, Charnise, Lin, Ting-Nien, Zhang, Ranran, Moriyama, Takaya, Yin, Zhaohong, Li, Zhenhua, Q

Journal:

Genome Research

Year:

2016

Language:

english

File:

PDF, 2.40 MB

english, 2016

4

An Output-Capacitorless Ultra-Low Power Low-Dropout Regulator

Cheng, Xin, Liang, Hongyu, Du, Longjie, Zhang, Zhang, Yi, Maoxiang, Xie, Guangjun

Journal:

Journal of Circuits System and Computers

Year:

2017

Language:

english

File:

PDF, 1.46 MB

english, 2017

5

Removal of Heavy Metals and Dyes by Supported Nano Zero-Valent Iron on Barium Ferrite Microfibers

Yang, Xinchun, Shen, Xiangqian, Jing, Maoxiang, Liu, Ruijiang, Lu, Yi, Xiang, Jun

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2014

Language:

english

File:

PDF, 5.02 MB

english, 2014

6

A highly reliable butterfly PUF in SRAM-based FPGAs

Xu, Xiumin, Liang, Huaguo, Huang, Zhengfeng, Jiang, Cuiyun, Ouyang, Yiming, Fang, Xiangsheng, Ni, Tianming, Yi, Maoxiang

Journal:

IEICE Electronics Express

Year:

2017

Language:

english

File:

PDF, 1.40 MB

english, 2017

7

[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - A BIST Scheme Based on Selecting State Generation of Folding Counters

Huaguo Liang,, Maoxiang Yi,, Xiangsheng Fang,, Cuiyun Jiang,

Year:

2005

Language:

english

File:

PDF, 168 KB

english, 2005

8

[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2017.4.9-2017.4.12)] 2017 IEEE 35th VLSI Test Symposium (VTS) - HLDTL: High-performance, low-cost, and double node upset tolerant latch design

Yan, Aibin, Huang, Zhengfeng, Yi, Maoxiang, Cui, Jie, Liang, Huaguo

Year:

2017

Language:

english

File:

PDF, 636 KB

english, 2017

9

Jitter-Quantizing-Based TRNG Robust Against PVT Variations

Lu, Yingchun, Liang, Huaguo, Yao, Liang, Wang, Xinyu, Qi, Haochen, Yi, Maoxiang, Jiang, Cuiyun, Huang, Zhengfeng

Journal:

Year:

2020

File:

PDF, 6.79 MB

2020

10

[IEEE 2010 Second Pacific-Asia Conference on Circuits,Communications and System (PACCS) - Beijing, China (2010.08.1-2010.08.2)] 2010 Second Pacific-Asia Conference on Circuits, Communications and System - A novel approach for test data volume reduction with multiple scan chains

Jie Liu,, Maoxiang Yi,, Fayong Zhao,

Year:

2010

Language:

english

File:

PDF, 343 KB

english, 2010

11

Study of Gamma Raysâ Dose Rates in the EAST Hall

Liu, Guangzhu, Hu, Liqun, Zhong, Guoqiang, Liu, Shixing, Yi, Maoxiang, Zhou, Ruijie, Li, Kai, Cao, Hongrui

Journal:

IEEE Transactions on Plasma Science

Year:

2020

File:

PDF, 3.83 MB

2020

12

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - A High Reliability FPGA Chip Identification Generator Based on PDLs

Zhou, Kai, Liang, Huaguo, Jiang, Yue, Huang, Zhengfeng, Yi, Maoxiang, Xu, Xiumin, Yao, Yao

Year:

2018

Language:

english

File:

PDF, 335 KB

english, 2018

13

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - A Low-Cost High-Efficiency True Random Number Generator on FPGAs

Ma, Gaoliang, Liang, Huaguo, Yao, Liang, Huang, Zhengfeng, Yi, Maoxiang, Xu, Xiumin, Zhou, Kai

Year:

2018

Language:

english

File:

PDF, 428 KB

english, 2018

14

A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs

Liang, Huaguo, Xu, Xiumin, Huang, Zhengfeng, Jiang, Cuiyun, Lu, Yingchun, Yan, Aibin, Ni, Tianming, Ouyang, Yiming, Yi, Maoxiang

Journal:

IEEE Transactions on Nuclear Science

Year:

2016

Language:

english

File:

PDF, 836 KB

english, 2016

15

[IEEE 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Yangzhou, China (2017.10.20-2017.10.22)] 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Multi-Vth technique based on potential critical paths for NBTI effect and leakage tradeoff

Yao, Zhang, Maoxiang, Yi, Keke, Wang, Qingwu, Wu, Li, Ding, Huaguo, Liang

Year:

2017

Language:

english

File:

PDF, 265 KB

english, 2017

16

[IEEE 2011 IEEE 10th International Conference on Trust, Security and Privacy in Computing and Communications (TrustCom) - Changsha, China (2011.11.16-2011.11.18)] 2011IEEE 10th International Conference on Trust, Security and Privacy in Computing and Communications - Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination

Mei, Chunlei, Yi, Maoxiang, Shen, Zhifei

Year:

2011

Language:

english

File:

PDF, 284 KB

english, 2011

17

[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - NBTI-induced circuit aging optimization by protectability-aware gate replacement technique

Zhang, Guimao, Yi, Maoxiang, Miao, Yong, Xu, Dawen, Liang, Huaguo

Year:

2015

Language:

english

File:

PDF, 234 KB

english, 2015

18

Facile Electrospinning Fabrication of CuO/C Composite Nanofibers with Superior Supercapacitor Performance

Qian, Xinye, Peng, Yi, Jin, Lina, Shen, Xiangqian, Jing, Maoxiang, Zhou, Youyuan, Xi, Xiaoming

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2016

Language:

english

File:

PDF, 1.91 MB

english, 2016

19

Specific TBC Domain-Containing Proteins Control the ER-Golgi-Plasma Membrane Trafficking of GPCRs

Wei, Zhe, Zhang, Maoxiang, Li, Chunman, Huang, Wei, Fan, Yi, Guo, Jianhui, Khater, Mostafa, Fukuda, Mitsunori, Dong, Zheng, Hu, Gang, Wu, Guangyu

Journal:

Year:

2019

File:

PDF, 3.50 MB

2019

20

The coalescence behavior of water and ethanol droplets: A molecular dynamic study

Que, Yi, Tian, Sen, Li, Maoxiang, Dai, Xuanyan

Journal:

Modern Physics Letters B

Year:

2020

File:

PDF, 8.69 MB

2020

21

A Novel -ploiting Strategy for Improving Performance of Test Data Compression

Maoxiang Yi, Huaguo Liang, Lei Zhang, Wenfa Zhan

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2010

Language:

english

File:

PDF, 345 KB

english, 2010

22

[IEEE 2009 International Conference on Computational Science and Engineering - Vancouver, BC, Canada (2009.08.29-2009.08.31)] 2009 International Conference on Computational Science and Engineering - Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing

Yi, Maoxiang, Liang, Huaguo, Zhan, Kaihua, Jiang, Cuiyun

Year:

2009

Language:

english

File:

PDF, 233 KB

english, 2009

23

[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory

Song, Tai, Liang, Huaguo, Sun, Ying, Huang, Zhengfeng, Yi, Maoxiang, Fang, Xiangsheng, Yan, Aibin

Year:

2019

Language:

english

File:

PDF, 1.39 MB

english, 2019

24

A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application

Yan, Aibin, Yang, Kang, Huang, Zhengfeng, Zhang, Jiliang, Cui, Jie, Fang, Xiangsheng, Yi, Maoxiang, Wen, Xiaoqing

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2018

Language:

english

File:

PDF, 346 KB

english, 2018

25

A novel BIST scheme for circuit aging measurement of aerospace chips

LIANG, Huaguo, FANG, Xiangsheng, YI, Maoxiang, HUANG, Zhengfeng, LU, Yingchun

Journal:

Chinese Journal of Aeronautics

Year:

2018

Language:

english

File:

PDF, 1.37 MB

english, 2018

26

[IEEE 2018 IEEE International Test Conference in Asia (ITC-Asia) - Harbin, China (2018.8.15-2018.8.17)] 2018 IEEE International Test Conference in Asia (ITC-Asia) - Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique

Yan, Aibin, Chen, Zhile, Huang, Zhengfeng, Fang, Xiangsheng, Yi, Maoxiang, Guo, Jing

Year:

2018

Language:

english

File:

PDF, 1.17 MB

english, 2018

27

Specific TBC Domain-Containing Proteins Control the ER-Golgi-Plasma Membrane Trafficking of GPCRs

Wei, Zhe, Zhang, Maoxiang, Li, Chunman, Huang, Wei, Fan, Yi, Guo, Jianhui, Khater, Mostafa, Fukuda, Mitsunori, Dong, Zheng, Hu, Gang, Wu, Guangyu

Journal:

Year:

2019

Language:

english

File:

PDF, 3.50 MB

english, 2019

28

Core-unified soc test data compression and application

Maoxiang Yi, Xueying Guo, Huaguo Liang, Wei Wang, Lei Zhang

Journal:

Journal of Electronics (China)

Year:

2010

Language:

english

File:

PDF, 302 KB

english, 2010

29

[IEEE 2014 International Conference on Information Science, Electronics and Electrical Engineering (ISEEE) - Sapporo, Japan (2014.4.26-2014.4.28)] 2014 International Conference on Information Science, Electronics and Electrical Engineering - Aspirating fire detection system with high sensitivity and multi-parameter

Shixing, Liu, Wei, Luo Xinxin Yao, Changzheng, Chen, Kun, Yin, Maoxiang, Yi, Haibing, Hu, Yongming, Zhang

Year:

2014

File:

PDF, 253 KB

2014

30

High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure

Wang, Xinyu, Liang, Huaguo, Wang, Yanjie, Yao, Liang, Guo, Yang, Yi, Maoxiang, Huang, Zhengfeng, Qi, Haochen, Lu, Yingchun

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2020

File:

PDF, 4.57 MB

2020

31

[IEEE 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Yangzhou, China (2017.10.20-2017.10.22)] 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Effective critical gate identification for mitigating circuit aging using gate replacement

Qingwu, Wu, Maoxiang, Yi, Shiqi, Yuan, Yao, Zhang, Li, Ding, Huaguo, Liang

Year:

2017

Language:

english

File:

PDF, 416 KB

english, 2017

32

[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - NBTI mitigation by M-IVC with input duty cycle and randomness constraints

Yi, Maoxiang, Liu, Xiaohong, Wu, Qingwu, Ni, Tianming, Huang, Zhengfeng, Liang, Huaguo

Year:

2016

Language:

english

File:

PDF, 1010 KB

english, 2016

33

Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology

Yan, Aibin, Huang, Zhengfeng, Yi, Maoxiang, Xu, Xiumin, Ouyang, Yiming, Liang, Huaguo

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2017

Language:

english

File:

PDF, 1.03 MB

english, 2017

34

[IEEE 2008 International Symposium on System-on-Chip (SOC) - Tampere, Finland (2008.11.5-2008.11.6)] 2008 International Symposium on System-on-Chip - Balancing wrapper chains of SoC core based on best interchange decreasing

Maoxiang Yi,, Huaguo Liang,, Zhengfeng Huang,

Year:

2008

Language:

english

File:

PDF, 303 KB

english, 2008

35

A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology

YAN, Aibin, LIANG, Huaguo, HUANG, Zhengfeng, JIANG, Cuiyun, YI, Maoxiang

Journal:

IEICE Transactions on Electronics

Year:

2015

Language:

english

File:

PDF, 1.66 MB

english, 2015

36

[IEEE 2016 International Symposium on Integrated Circuits (ISIC) - Singapore (2016.12.12-2016.12.14)] 2016 International Symposium on Integrated Circuits (ISIC) - Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect

Maoxiang Yi,, Yingxian Gan,, Zhengfeng Huang,, Huaguo Liang,

Year:

2016

Language:

english

File:

PDF, 713 KB

english, 2016

37

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS

Yan, Aibin, Ling, Yafei, Yang, Kang, Chen, Zhili, Yi, Maoxiang

Year:

2018

Language:

english

File:

PDF, 661 KB

english, 2018

38

A low-leakage and NBTI-mitigated N-type domino logic

Liang, Huaguo, Xu, Hui, Huang, Zhengfeng, Yi, Maoxiang

Journal:

Journal of Semiconductors

Year:

2014

Language:

english

File:

PDF, 921 KB

english, 2014

39

[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - NBTI aging analysis and aging-tolerant design of p-type domino AND gatesp

Zhang Lin,, Yi Maoxiang,, Yuan Ye,, Gan Yingxian,, Xu Hui,, Liang Huaguo,

Year:

2015

Language:

english

File:

PDF, 7.01 MB

english, 2015

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